TTTC Newsletter
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TTTC Newsletter
IEEE Latin-American Test Workshop (LATW 06) 26-29 March 2006 Buenos Aires, Argentina The IEEE Latin-American Test Workshop provides an annual forum for test and fault tolerance professionals and technologists from Latin America and all over the world. Participants will present and discuss various aspects of system, board, and component testing and fault tolerance with respect to design, manufac...
متن کامل2015 JETTA-TTTC Best Paper Award
Award winning paper, “Secure JTAG Implementation Using Schnorr Protocol,” Journal of Electronic Testing: Theory and Applications (JETTA), Volume 29, Number 2, pages 193–209, April 2013. Authors: Amitabh Das, Jean Da Rolt, Santosh Ghosh, Stefaan Seys, Sophie Dupuis, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre and Ingrid Verbauwhede Award Committee: Matteo Sonza Reorda (Chair), Vishwani...
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Dear reader, This here is the third installment of the Fundamental Issues in Modelling, Verification and Evolution of Software (MoVES) newsletter. The goal of the newsletter is to highlight the work performed in the context of the project through the different workpackages. As with previous issues, this edition of the newsletter is divided in two parts, the first one focusing on the results ach...
متن کاملNewsletter 149
The negative relationship between stock market P/E ratios and government bond yields seems to have become conventional wisdom among practitioners. Both limited empirical evidence and a misleading suggestion that the model originated in the Fed are used to support the model's plausibility. This article argues that the Fed model is flawed from a theoretical standpoint and reports evidence from 20...
متن کاملMoves Newsletter
Dear Reader, this edition of the MoVES newsletter is dedicated to Workpackage 6, focused on verification methods and tools, and presents results obtained by the University of Liège on that topic. This issue of the newsletter describes three recent results that cover different research topics in the field of verification. The first result, presented on p. 2, introduces an original method for ana...
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ژورنال
عنوان ژورنال: IEEE Design & Test
سال: 2020
ISSN: 2168-2356,2168-2364
DOI: 10.1109/mdat.2019.2952356